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Electrical characterization of Au/Pd/n-GaN/Pd/Au device structure in the radio frequency range by simulation study 

Kavasoglu, A. Sertap; Kavasoglu, Nese; Oylumluoglu, Gorkem (Elsevier Science Sa, 2011)
GaN based devices are highly promising optoelectronic devices for many years due to their useful applications in photovoltaic energy conversation, fiber optic communication and atmosphere monitoring. GaN based devices such ...

Intensity modulated short circuit current spectroscopy for solar cells 

Kavasoglu, Nese; Kavasoglu, A. Sertap; Birgi, Ozcan; Oktik, Sener (Elsevier Science Bv, 2011)
Understanding charge separation and transport is momentously important for the rectification of solar cell performance. To probe photo-generated carrier dynamics, we implemented intensity modulated short circuit current ...

Electrical characterization of a-Si:H(n)/c-Si(p) structure 

Kavasoglu, A. Sertap; Birgi, Ozcan; Kavasoglu, Nese; Oylumluoglu, Gorkem; Kodolbas, A. Osman; Kangi, Rifat; Yilmaz, Okan (Elsevier Science Sa, 2011)
In this study, n-type hydrogenated amorphous silicon (a-Si:H) was fabricated on p-type crystalline silicon (c-Si) substrates to obtain heterojunction diodes. The amorphous films were obtained by the Plasma Enhanced Chemical ...

I-V-T analysing an inhomogeneous Au/Poly(4-vinyl phenol)/p-Si structure with a double Gaussian distribution of barrier heights 

Pakma, Osman; Tozlu, Cem; Kavasoglu, Nese; Kavasoglu, A. Sertap; Ozden, Sadan (Springer, 2011)
In this study, the current-voltage (I-V) characteristics of Au/Poly(4-vinyl phenol)/p-Si structures have been measured over a wide temperature range (100-300 K). These structures have been analyzed according to thermionic ...



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Kavasoglu, A. Sertap (4)
Kavasoglu, Nese (4)Birgi, Ozcan (2)Oylumluoglu, Gorkem (2)Kangi, Rifat (1)Kodolbas, A. Osman (1)Oktik, Sener (1)Ozden, Sadan (1)Pakma, Osman (1)Tozlu, Cem (1)... View MoreSubjectInterface States (2)C-V and G-V Characteristics (1)Capacitance Anomaly (1)Current-Voltage Measurements (1)Double Gaussian (1)I-V-T Characteristics (1)Impedance Spectroscopy (1)Intensity Modulated Short Circuit Current Spectroscopy (1)Metal-Insulator-Semiconductor (1)Optoelectronic Transfer Function (1)... View MoreDate Issued
2011 (4)
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