High resolution short focal distance Bent Crystal Laue Analyzer for copper K edge x-ray absorption spectroscopy

Abstract

We have developed a compact short focal distance Bent Crystal Laue Analyzer (BCLA) for Cu speciation studies of biological systems with specific applications to cancer biology. The system provides high energy resolution and high background rejection. The system is composed of an aluminum block serving as a log spiral bender for a 15 micron thick Silicon 111 crystal and a set of soller slits. The energy resolution of the BCLA-about 14 eV at the Cu K alpha line-allows resolution of the Cu K alpha(1) and CuK alpha(2) lines. The system is easily aligned by using a set of motorized XYZ linear stages. Two operation modes are available: incident energy scans (IES) and emission energy scans (EES). IES allows scanning of the incident energy while the BCLA system is maintained at a preselected fixed position-typically CuK alpha(1) line. EES is used when the incident energy is fixed and the analyzer is scanned to provide the peak profile of the emission lines of Cu. (C) 2011 American Institute of Physics. [doi:10.1063/1.3595675]