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dc.contributor.authorGündüz, Gürhan
dc.date.accessioned2022-11-30T12:49:08Z
dc.date.available2022-11-30T12:49:08Z
dc.date.issued2022en_US
dc.identifier.citationG. Gündüz, "Analysis of Popularity Degradation in P2P Overlay Topology," 2022 7th International Conference on Computer Science and Engineering (UBMK), 2022, pp. 1-6, doi: 10.1109/UBMK55850.2022.9919512.en_US
dc.identifier.isbn978-166547010-0
dc.identifier.urihttps://hdl.handle.net/20.500.12809/10423
dc.description.abstractUnstructured Peer-to-Peer(P2P) networks can scale to very large number of peers. Therefore, the topology of the P2P networks affects the performance of searches to find items. Popularity based P2P overlay topologies are proved to be efficient for finding popular or to-be-popular items since they consider item popularity when growing the topology. Naturally, items or trends will lose their popularity either suddenly or slowly in time. Therefore, the reaction of the topology when an item lost its popularity is important as well. In this work, we investigate to topology reaction to sudden popularity losses in a popularity based P2P networks.en_US
dc.item-language.isoengen_US
dc.publisherInstitute of Electrical and Electronics Engineers Inc.en_US
dc.relation.isversionof10.1109/UBMK55850.2022.9919512.en_US
dc.item-rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectOverlay topologyen_US
dc.subjectPeer-to-Peer networksen_US
dc.subjectPopularity losten_US
dc.subjectPopularity-baseden_US
dc.subjectScale-freeen_US
dc.titleAnalysis of Popularity Degradation in P2P Overlay Topologyen_US
dc.item-typeconferenceObjecten_US
dc.contributor.departmentMÜ, Mühendislik Fakültesi, Bilgisayar Mühendisliği Bölümüen_US
dc.contributor.authorID0000-0002-0719-2688en_US
dc.contributor.institutionauthorGündüz, Gürhan
dc.identifier.startpage216en_US
dc.identifier.endpage221en_US
dc.relation.journalProceedings - 7th International Conference on Computer Science and Engineering, UBMK 2022en_US
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanıen_US


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