Yazar "Cansever, Hamza" için listeleme
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Investigation of meta- and in-stability effects in hydrogenated microcrystalline silicon thin films by the steady-state measurement methods
Güneş, Mehmet; Cansever, Hamza; Yılmaz, Gökhan; Sagban, Muzaffer H.; Smirnov, Vladimir; Finger, Friedhelm; Brueggemann, Rudolf (Canadian Science Publishing, Nrc Research Press, 2014)Metastability effects because of atmospheric exposure, high purity gasses, and deionized water in hydrogenated microcrystalline silicon thin films with different crystalline volume fractions were studied using well accepted ... -
Investigation of metastability and instability effects on the minority carrier transport properties of microcrystalline silicon thin films by using the steady-state photocarrier grating technique
Cansever, Hamza; Güneş, Mehmet; Yılmaz, Gökhan; Sagban, H. Muzaffer; Smirnov, Vladimir; Finger, Friedhelm; Brueggemann, Rudolf (Canadian Science Publishing, Nrc Research Press, 2014)Metastability effects in hydrogenated microcrystalline silicon thin films due to air, high purity nitrogen, helium, argon, and oxygen were investigated using temperature-dependent dark conductivity, photoconductivity, and ... -
Metastability effects in hydrogenated microcrystalline silicon thin films investigated by the dual beam photoconductivity method
Gunes, Mehmet; Cansever, Hamza; Yilmaz, Gokhan; Smirnov, Vladimir; Finger, Friedhelm; Brueggemann, Rudolf (Elsevier Science Bv, 2012)Metastability effects in microcrystalline silicon (mu c-Si:H) thin films have been investigated using dark conductivity, sigma(D), photoconductivity, sigma(ph), and sub-bandgap absorption methods. Nitrogen and inert gasses ... -
Reversible and irreversible effects after oxygen exposure in thick (> 1 mu m) silicon films deposited by VHF-PECVD on glass substrates investigated by dual beam photoconductivity
Yılmaz, Gökhan; Cansever, Hamza; Sagban, H. Muzaffer; Güneş, Mehmet; Smirnov, Vladimir; Finger, Friedhelm; Brueggemann, Rudi (Canadian Science Publishing, Nrc Research Press, 2014)Metastability and instability effects due to oxygen exposure in thick intrinsic hydrogenated microcrystalline silicon films deposited by very high frequency plasma enhanced chemical vapour deposition on smooth glass ...
