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dc.contributor.authorZabierowski, P.
dc.contributor.authorStankiewicz, K.
dc.contributor.authorDonmez, A.
dc.contributor.authorCouzinie-Devy, F.
dc.contributor.authorBarreau, N.
dc.date.accessioned2020-11-20T16:33:21Z
dc.date.available2020-11-20T16:33:21Z
dc.date.issued2011
dc.identifier.issn0040-6090
dc.identifier.urihttps://doi.org/10.1016/j.tsf.2010.12.083
dc.identifier.urihttps://hdl.handle.net/20.500.12809/4346
dc.description10th Symposium M of the 2010 E-MRS on Thin Film Chalcogenide Photovoltaic MaterialsEMRS Spring Meeting Symposium M - Thin Film Chalcogenide Photovoltaic Materials - 2010JUN 07-11, 2010 - San Francisco, CAStrasburg, FRANCEen_US
dc.descriptionZabierowski, Pawel/0000-0001-5277-8285; Barreau, Nicolas/0000-0002-8423-153Xen_US
dc.descriptionWOS: 000295347700084en_US
dc.description.abstractThe goal of this work is to classify and systematically investigate the N-1 Deep Level Transient Spectroscopy (DLTS) response characteristic for Cu(In,Ga)Se-2-based heterojunctions. Up to four different peaks giving rise to the N-1 signal are observed. It is shown that the contribution of the components strongly depends on the metastable state of the sample (different kind of light soaking and reverse bias treatment) and measurement conditions. In the second part of the paper the unusual features of the N-1 response, such as an enormously high signal level, are discussed. It is argued, basing on the correlations between capacitance-voltage curves and DLTS spectra, that some of the properties might be due to intrinsic In-Cu DX centers. (C) 2010 Elsevier B.V. All rights reserved.en_US
dc.description.sponsorshipMETACISen_US
dc.description.sponsorshipThis work was supported by METACIS POLONIUM project.en_US
dc.item-language.isoengen_US
dc.publisherElsevier Science Saen_US
dc.item-rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectCigseen_US
dc.subjectDLTSen_US
dc.subjectDX Centeren_US
dc.subjectN-1 Signalen_US
dc.subjectDefectsen_US
dc.subjectMetastabilityen_US
dc.titleSystematic study of the complex structure of N-1 Deep Level Transient Spectroscopy signal in Cu(In,Ga)Se-2 based heterojunctionsen_US
dc.item-typeconferenceObjecten_US
dc.contributor.departmenten_US
dc.contributor.departmentTemp[Zabierowski, P.; Stankiewicz, K.] Warsaw Univ Technol, Fac Phys, PL-00662 Warsaw, Poland -- [Donmez, A.] Mugla Univ, Clean Energy Res & Dev Ctr, Mugla, Turkey -- [Couzinie-Devy, F.; Barreau, N.] Univ Nantes, CNRS, Inst Mat Jean Rouxel IMN UMR 6502, F-44322 Nantes 3, Franceen_US
dc.identifier.doi10.1016/j.tsf.2010.12.083
dc.identifier.volume519en_US
dc.identifier.issue21en_US
dc.identifier.startpage7485en_US
dc.identifier.endpage7488en_US
dc.relation.journalThin Solid Filmsen_US
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanıen_US


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