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dc.contributor.authorBayhan, Habibe
dc.contributor.authorKavasoğlu, Abdulkadir Sertap
dc.date.accessioned2020-11-20T16:45:09Z
dc.date.available2020-11-20T16:45:09Z
dc.date.issued2005
dc.identifier.issn0038-1101
dc.identifier.issn1879-2405
dc.identifier.urihttps://doi.org/10.1016/j.sse.2005.03.012
dc.identifier.urihttps://hdl.handle.net/20.500.12809/5284
dc.description0000-0001-7792-0305en_US
dc.descriptionWOS: 000229906500020en_US
dc.description.abstractThis article investigates the results of current-voltage measurements made at different temperatures on vacuum deposited ZnO/CdS/Cu(In,Ga)Se-2 and CdS/CdTe heterojunction solar cells. We propose that the current-voltage data of a typical CdS/CdTe solar cell can be analysed by tunnelling enhanced bulk and interface recombination which gives a quantitative description of the electronic loss mechanisms in the chalcopyrite based heterojunction solar cells. We show that the temperature dependence of the saturation current and the diode ideality factor of the CdS/CdTe device are well described by this model. Below 240 K, tunnelling enhanced recombination at junction interface is found to play a major role for recombination with activation and tunnelling energies as about 0.77 eV and E-00 = 36 meV, respectively. The transport mechanism in ZnO/CdS/Cu(In,Ga)Se-2 device appeared to be also dominated by interface recombination. This unexpected behaviour is attributed to the presence of Cu-rich and indium depleted thin layer which might possibly be formed on the absorber surface. (c) 2005 Elsevier Ltd. All rights reserved.en_US
dc.item-language.isoengen_US
dc.publisherPergamon-Elsevier Science Ltden_US
dc.item-rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectCdTeen_US
dc.subjectCIGSen_US
dc.subjectsolar cellen_US
dc.subjecttunnellingen_US
dc.subjectrecombinationen_US
dc.titleTunnelling enhanced recombination in polycrystalline CdS/CdTe and CdS/Cu(In,Ga)Se-2 heterojunction solar cellsen_US
dc.item-typearticleen_US
dc.contributor.departmentMÜ, Fen Fakültesi, Fizik Bölümüen_US
dc.contributor.institutionauthorBayhan, Habibe
dc.contributor.institutionauthorKavasoğlu, Abdulkadir Sertap
dc.identifier.doi10.1016/j.sse.2005.03.012
dc.identifier.volume49en_US
dc.identifier.issue6en_US
dc.identifier.startpage991en_US
dc.identifier.endpage996en_US
dc.relation.journalSolid-State Electronicsen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US


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